Intro to Benchtop EMC Testing: Practical CISPR 25 Measurements on a Budget
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Electromagnetic compatibility and EMC testing trip up a lot of otherwise solid designs. In this Elektor webinar, RF/EMC engineer Sebastian from Baltic Lab explained and demonstrated a compact CISPR 25 conducted-emissions setup you can replicate on a workbench, plus a clear workflow for diagnosing and fixing problems early.
What’s Covered in the EMC Testing Webinar
• EMC essentials: emissions vs immunity; radiated vs conducted, and why conducted issues are often missed
• CISPR 25 voltage-method setup: reference ground plane, two 5 µH LISNs bonded to the plane, 50 Ω terminations, transient limiter, and required RBW/detectors (9 kHz below 30 MHz; 120 kHz above; peak and average)
• Cabling and fixtures that matter: straight supply leads on 50 mm dielectric spacers; keep long measurement leads off the bench to avoid “mystery” failures
• Mode separation: using a LISN combiner to view common-mode and differential-mode noise separately so fixes are targeted
• Cost reality: a usable pre-compliance bench if you already own a spectrum analyzer; batteries or well-filtered supplies to keep the source ≥6 dB below limits
Live demo highlights
• A cheap LM2596 buck module fails badly at low frequencies (classic for switchers). A snap-on ferrite barely helps because the dominant energy is differential-mode.
• Two series inductors (≈470 µH each) at the input bring the trace under the CISPR 25 Class 3 limits for the demo conditions, with remaining common-mode residue visible but controlled.
• Standards protect specific bands; passing the defined range doesn’t guarantee quiet behavior elsewhere, so background checks and clean wiring matter.
Sponsor
This was a €50 webinar, brought to you free by eeNews Europe, a digital publication covering the global electronics market!

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