All items tagged with Test Measurement News and Embedded AI News (88)

| System check! Elektor wants to know: Which microcontroller family do you use most often? How often? What matters most when you select a micr...

| System check! Elektor wants to know: What frustrates you most during a typical engineering project? What is the biggest root cause of projec...

| System check! Elektor wants to know your opinion about wireless protocols. Which do you use most often? Which wireless protocol will grow th...

| DigiKey demos at embedded world 2026 showed a practical mix of LEDs, FPGA learning, robotics, gesture sensing, embedded AI, and Red Pitaya i...

| Elektor partners with oemsecrets to embed an electronic component search tool directly into articles. Engineers can quickly find, compare, a...

| This Scrutiny Debugger demo shows how live variable monitoring, continuous graphing, and trigger-based capture can work on an STM32 target w...

| A few engineers and innovators share details about practical test and measurement habits that save time and help avoid poor results. They ta...

| The Scrutiny Debugger webinar is now available to watch, and it is a useful session for embedded developers who need live visibility into fi...

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| One of the simplest ways to generate a DC analog voltage level from a microcontroller is by using its built-in pulse-width modulation (PWM)...

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| To weigh large items like bicycles or suitcases, standard scales are often impractical. This solution uses up to four small scales that tran...